Company Filing History:
Years Active: 2024
Title: Innovations of Jonathan H Turner in Material Orientation Imaging
Introduction
Jonathan H Turner is an accomplished inventor based in Albuquerque, NM (US). He has made significant contributions to the field of optical technologies, particularly in the analysis and imaging of material orientation. His innovative work has led to the development of a unique polarimeter that enhances the understanding of microstructural materials.
Latest Patents
Turner's most notable patent is titled "Polarimeter with multiple independent tunable channels and method for material orientation imaging." This invention discloses a polarimeter and a method for analyzing and imaging the microstructural material orientation of a sample. The polarimeter, which is a partial Mueller-matrix polarimeter (pMMP), utilizes multiple independent polarization channels through two independent polarization modulators. These modulators switch serially among various settings, allowing for the creation of spatially registered images that are synchronized with the polarization channels. A processor executes a classification algorithm that maps these images to material orientation values, enabling the creation of microstructural orientation images of diverse anisotropic materials.
Career Highlights
Jonathan H Turner is associated with Advanced Optical Technologies, Inc., where he continues to push the boundaries of optical innovation. His work has been instrumental in advancing the capabilities of material analysis, particularly in applications involving polymer domains, fiber bundles, and metallic crystalline grains.
Collaborations
Turner collaborates with Brian G Hoover, contributing to the development of advanced optical technologies and enhancing the research capabilities of their organization.
Conclusion
Jonathan H Turner is a pioneering inventor whose work in polarimetry and material orientation imaging has made a significant impact in the field of optical technologies. His innovative approaches continue to shape the future of material analysis and imaging.