Company Filing History:
Years Active: 2013
Title: Jon R Phillips: Innovator in Isotope Ratio Analysis
Introduction
Jon R Phillips is a distinguished inventor based in Richland, WA (US). He has made significant contributions to the field of isotope ratio analysis, showcasing his expertise through innovative patents. His work is particularly notable for its high precision and accuracy in measuring isotope ratios.
Latest Patents
Jon R Phillips holds a patent for a "System and method for high precision isotope ratio destructive analysis." This invention provides a system and process that deliver high accuracy and high precision destructive analysis measurements for isotope ratio determination of relative isotope abundance distributions in various samples, including liquids, solids, and particulates. The technology utilizes a collinear probe beam to interrogate a laser-ablated plume, achieving enhanced single-shot detection sensitivity approaching the femtogram range. The isotope ratios can be determined with approximately 1% or better precision and accuracy, making it a significant advancement in the field.
Career Highlights
Phillips is associated with the Battelle Memorial Institute, where he applies his innovative ideas to real-world challenges. His work at Battelle has allowed him to collaborate with other experts in the field, further enhancing the impact of his inventions.
Collaborations
Some of his notable coworkers include Bruce A Bushaw and Norman C Anheier. Their collaboration has contributed to the advancement of technologies in isotope analysis.
Conclusion
Jon R Phillips is a prominent figure in the field of isotope ratio analysis, with a patent that exemplifies his innovative spirit and technical expertise. His contributions continue to influence the scientific community and enhance analytical methodologies.