Columbus, OH, United States of America

Jon Francis Pugh


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 1977

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Jon Francis Pugh: Innovator in Thin Film Measurement Technology

Introduction

Jon Francis Pugh is a notable inventor based in Columbus, OH (US). He has made significant contributions to the field of thin film measurement technology. His innovative approach has led to the development of a patented method that minimizes wave interference effects, enhancing the accuracy of measurements in various applications.

Latest Patents

Jon Pugh holds a patent for "Minimizing wave interference effects on the measurement of thin films." This invention addresses the challenges associated with measuring properties of thin, infrared radiation-transmissive films. By utilizing first and second infrared radiations with carefully selected wavelengths, Pugh's method allows for substantial freedom from errors caused by wave interference effects. The technique involves directing beams of radiation from multiple points onto the film surface at various incidence angles, ensuring a broad spectrum of path lengths. The detected intensities of the two radiations provide a response indicative of the film property, showcasing Pugh's innovative approach to solving complex measurement issues.

Career Highlights

Jon Pugh is associated with Industrial Nucleonics Corporation, where he applies his expertise in thin film technology. His work has contributed to advancements in measurement techniques that are crucial for various industrial applications. Pugh's dedication to innovation is evident in his patent, which reflects his commitment to improving measurement accuracy.

Collaborations

Jon Pugh has collaborated with Paul Williams, a fellow innovator in the field. Their partnership has likely fostered the exchange of ideas and expertise, further enhancing the development of measurement technologies.

Conclusion

Jon Francis Pugh's contributions to thin film measurement technology exemplify the spirit of innovation. His patented method not only addresses significant challenges in the field but also showcases the importance of collaboration in advancing technology.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…