Company Filing History:
Years Active: 2007-2015
Title: Jon Fleig: Innovator in Optical Measurement Technologies
Introduction
Jon Fleig is a notable inventor based in Rochester, NY (US), recognized for his contributions to optical measurement technologies. With a total of 3 patents, Fleig has made significant advancements in the field of aspheric optical surfaces.
Latest Patents
Fleig's latest patents include an integrated wavefront sensor and profilometer. This innovative instrument is designed for measuring aspheric optical surfaces and combines both an optical wavefront sensor and a single-point optical profilometer. The optical wavefront sensor effectively measures surface height variations across various areas of an aspheric test surface. Additionally, the single-point profilometer measures surface height variations along specific traces on the aspheric test surface. Notably, at least one of these traces intersects with one of the areas, ensuring that the spatial frames of reference for the traces and areas are adapted to minimize discrepancies between points of nominal coincidence.
Another significant patent is a method for accurate high-resolution measurements of aspheric surfaces. This system comprises multiple methods for measuring surfaces or wavefronts from a test part, achieving greatly improved accuracy, especially for higher spatial frequencies on aspheres. The methods involve multiple measurements of a test part, including calibration and control of the focusing components of a metrology gauge. This calibration helps avoid loss of resolution and accuracy when the test part is repositioned. Furthermore, the methods extend conventional averaging techniques to suppress higher spatial-frequency structures in the gauge's inherent slope-dependent inhomogeneous bias.
Career Highlights
Jon Fleig is currently employed at QED Technologies International, Inc., where he continues to innovate in the field of optical measurement. His work has significantly impacted the accuracy and efficiency of measuring aspheric surfaces.
Collaborations
Fleig collaborates with talented coworkers, including Paul Murphy and Greg W. Forbes, contributing to the advancement of optical technologies.
Conclusion
Jon Fleig's innovative work in optical measurement technologies has led to significant advancements in the field, particularly with his latest patents. His contributions continue to shape the future of aspheric surface measurement.