Company Filing History:
Years Active: 2005
Title: Johnny J Leblanc: Innovator in Microprocessor Testing
Introduction
Johnny J Leblanc is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of microprocessor testing through his innovative patent. His work focuses on enhancing fault testing mechanisms, which are crucial for ensuring the reliability of microprocessor chips.
Latest Patents
Johnny J Leblanc holds a patent for an "Enhanced debug scheme for LBIST." This invention provides a device for fault testing in microprocessor chips. The LBIST circuit includes a first reference signature and a loading unit that receives and outputs a set of masking data. Additionally, a file unit is connected to the loading unit to receive the masking data. A masking unit generates a second reference signature based on the masking data and scanning data from a scan string in the chip. Finally, a signature logic compresses the second reference signature and inputs it to the LBIST circuit, replacing the first reference signature. This innovative approach enhances the efficiency and accuracy of fault testing in microprocessors.
Career Highlights
Johnny J Leblanc is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM allows him to work on cutting-edge technologies and contribute to advancements in microprocessor design and testing.
Collaborations
Throughout his career, Johnny has collaborated with talented individuals such as Sam Gat-Shang Chu and Joachim Gerhard Clabes. These collaborations have fostered innovation and have been instrumental in the development of his patent.
Conclusion
Johnny J Leblanc is a distinguished inventor whose work in microprocessor testing has made a significant impact in the field. His patent for an enhanced debug scheme demonstrates his commitment to innovation and excellence in technology.