Lancaster, CA, United States of America

John T White


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: John T White: Innovator in Electrochemical Surface Analysis

Introduction

John T White is a notable inventor based in Lancaster, CA (US). He has made significant contributions to the field of electrochemical analysis, particularly through his innovative patent that enhances the accuracy and efficiency of surface analysis techniques.

Latest Patents

John T White holds a patent for "Electrochemical surface analysis using deoxygenated gel electrolyte." This invention provides advantages over traditional liquid electrolytes in processes such as sequential electrochemical reduction analysis. The use of a deoxygenated gel electrolyte, such as a borate buffer solution with a gelling agent, allows for localized electrochemical analysis while minimizing the effects of atmospheric oxygen. This innovation enables more precise testing of electronic components and circuit boards, ensuring that the analysis is focused on the area of interest without interference from external factors.

Career Highlights

John T White is currently associated with Rockwell Technologies, Inc., where he applies his expertise in electrochemical analysis. His work has been instrumental in advancing the methodologies used in the testing of electronic components, contributing to the reliability and performance of various technologies.

Collaborations

John collaborates with D Morgan Tench, leveraging their combined expertise to further enhance the capabilities of electrochemical analysis techniques. Their partnership has led to innovative solutions that address challenges in the field.

Conclusion

John T White's contributions to electrochemical surface analysis demonstrate his commitment to innovation and excellence in the field. His patent and ongoing work at Rockwell Technologies, Inc. highlight the importance of advancements in testing methodologies for electronic components.

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