John Mark Thornell

Title: John Mark Thornell: Innovator in Inspection Systems

Introduction

John Mark Thornell is a notable inventor based in Plano, Texas. He has made significant contributions to the field of inspection systems, holding two patents that showcase his innovative approach to technology. His work focuses on enhancing the efficiency and accuracy of component inspections.

Latest Patents

Thornell's latest patents include a "System and method for inspection using off-angle lighting." This system utilizes an axial lighting system to illuminate components, allowing for better visibility of features. It also incorporates an off-axis lighting system to enhance the inspection process further. Another patent, "System and method for locating image features," provides a method for comparing component data with test image data, facilitating the identification of features in image data.

Career Highlights

Throughout his career, Thornell has worked with reputable companies such as Semiconductor Technology & Instruments, Inc. and August Technology Corporation. His experience in these organizations has contributed to his expertise in developing advanced inspection systems.

Collaborations

Thornell has collaborated with notable individuals in his field, including Clyde Maxwell Guest and Ramiro Castellanos-Nolasco. These collaborations have likely enriched his work and led to innovative solutions in inspection technology.

Conclusion

John Mark Thornell's contributions to inspection systems through his patents and career experiences highlight his role as an innovator in the field. His work continues to influence the way components are inspected and analyzed.