John J Plombon

Title: John J Plombon: Innovator in Atomic Force Microscopy

Introduction

John J Plombon is a notable inventor based in San Francisco, CA. He has made significant contributions to the field of atomic force microscopy (AFM). His innovative approach has led to advancements in measuring microscopic features with greater accuracy.

Latest Patents

John J Plombon holds a patent for "Interpolated height determination in an atomic force microscope." This invention provides a method and apparatus associated with an AFM to more accurately measure the height of microscopic features in a substrate, particularly those with sloping faces. The process involves sequentially positioning the probe tip at various vertical positions approaching the surface being probed. At each position, the vertical force encountered by the probe tip is measured and stored in memory along with its corresponding vertical position. When the measured force exceeds a threshold, the downward movement is halted, and the accumulated data is analyzed. The controller fits the data to two curves, allowing for the determination of the height of the feature in the surface.

Career Highlights

John J Plombon is currently employed at Surface/interface, Inc. His work focuses on enhancing the capabilities of atomic force microscopy, contributing to the precision and effectiveness of measurements in various applications.

Collaborations

He has collaborated with notable colleagues, including Andreas Berghaus and Charles E Bryson, III. Their combined expertise has furthered the development of innovative solutions in the field of microscopy.

Conclusion

John J Plombon's contributions to atomic force microscopy exemplify the impact of innovation in scientific research. His patent and collaborative efforts continue to advance the field, showcasing the importance of precision in measuring microscopic features.