Company Filing History:
Years Active: 1991
Title: John I Hickman: Innovator in Integrated Circuit Testing
Introduction
John I Hickman is a notable inventor based in Cooper, Texas. He has made significant contributions to the field of integrated circuit testing. His innovative work has led to the development of a unique patent that enhances the efficiency of testing integrated circuits.
Latest Patents
Hickman's most recent patent is titled "Value-strength based test pattern generator and process." This invention involves an automatic test pattern generator that assigns value-strength numbers to selected nodes. These nodes represent the electrical characteristic strength of integrated circuits, including field effect transistors and their logic state values. The value-strength numbers are sensitized to the inputs of the selected node and propagated to the outputs, establishing patterns for test signals. These test signals are crucial for chip testers to determine the functionality of integrated circuit chips. Additionally, the value-strength numbers are utilized in dynamic testing of the integrated circuit nodes, using clock signals to capture transitions at specific nodes within a known clock period.
Career Highlights
John I Hickman is associated with Texas Instruments Corporation, a leading company in the semiconductor industry. His work at Texas Instruments has allowed him to focus on advancing technologies related to integrated circuits. With a total of 1 patent, Hickman has demonstrated his commitment to innovation in this field.
Collaborations
Throughout his career, Hickman has collaborated with talented individuals such as Theo J Powell and Jeri J Crowley. These collaborations have contributed to the development of cutting-edge technologies in integrated circuit testing.
Conclusion
John I Hickman is a distinguished inventor whose work has significantly impacted the field of integrated circuit testing. His innovative patent showcases his expertise and dedication to advancing technology. His contributions continue to influence the industry and improve testing methodologies for integrated circuits.