John Hanselman

Title: John Hanselman: Innovator in Acoustic Waveguide Technology

Introduction

John Hanselman is a notable inventor based in Needham, MA (US). He has made significant contributions to the field of measurement technology, particularly in the area of film thickness measurement. With a total of 3 patents to his name, Hanselman continues to push the boundaries of innovation.

Latest Patents

One of Hanselman's latest patents is a method and device for measuring the thickness of opaque and transparent films. This innovative method involves exciting time-dependent acoustic waveguide modes in a thin sample using an excitation radiation field. The acoustic waveguide modes are detected by diffracting probe radiation off a ripple morphology induced on the sample's surface. The diffracted probe radiation is then analyzed to measure phase velocities or frequencies of the acoustic waveguide modes. By comparing the measured phase velocities or frequencies to those calculated from a mathematical model, the thickness of the thin sample can be accurately determined.

Career Highlights

Hanselman is currently associated with Active Impulse Systems, Inc., where he applies his expertise in measurement technologies. His work has been instrumental in advancing the methods used for film thickness measurement, which has applications in various industries.

Collaborations

Some of his notable coworkers include Keith Adam Nelson and John A Rogers, who have collaborated with him on various projects.

Conclusion

John Hanselman is a distinguished inventor whose work in acoustic waveguide technology has paved the way for advancements in film thickness measurement. His contributions continue to impact the field positively.