Company Filing History:
Years Active: 1993
Title: The Innovations of Johannes M. Beltman
Introduction
Johannes M. Beltman is a notable inventor based in Veldhoven, Netherlands. He has made significant contributions to the field of imaging technology, particularly through his innovative patent. His work is recognized for its impact on imaging systems and focus detection mechanisms.
Latest Patents
Johannes M. Beltman holds a patent for an "Imaging apparatus having a focus-error and/or tilt detection device." This imaging apparatus features an imaging system and a focus detection device that determines the deviation between the image plane of the imaging system and a second plane where imaging is intended to occur. The focus error detection system includes a radiation source that supplies a beam with a wide wavelength band, along with an object grating and an image grating that are imaged onto each other via the second plane. The system can utilize a reference beam reflected by the outer surface of the imaging system, either in combination with or independently from the wideband beam and the gratings. This innovative approach allows for the realization of a tilt detection device that can accurately detect the position of the second plane in relation to the image plane.
Career Highlights
Johannes M. Beltman is associated with U.S. Philips Corporation, where he has contributed to advancements in imaging technology. His work has been instrumental in enhancing the functionality and accuracy of imaging systems.
Collaborations
Throughout his career, Johannes has collaborated with notable colleagues, including Jan E. Van Der Werf and Marinus Aart Van Den Brink. These collaborations have fostered innovation and development in their respective fields.
Conclusion
Johannes M. Beltman's contributions to imaging technology through his patent demonstrate his expertise and commitment to innovation. His work continues to influence advancements in imaging systems, showcasing the importance of focus detection mechanisms in modern technology.