Joe Danko

Title: The Innovative Contributions of Joe Danko

Introduction

Joe Danko is a notable inventor based in Franklin, MA (US). He has made significant contributions to the field of semiconductor technology. His innovative approach has led to the development of a unique method for inspecting semiconductor wafers.

Latest Patents

Joe Danko holds a patent for a "Method and apparatus for inspecting a semiconductor wafer." This invention focuses on inspecting the surface of semiconductor wafers for contaminant particles. The apparatus includes a light source that illuminates the surface of the wafer. A camera positioned above the surface detects light scattered by any particles present. The camera captures light over a defined field of view, which is determined by the camera and a focusing lens. A computer is integrated with the camera to store, process, identify, and analyze the detected light. It also calculates a dynamic minimum light intensity threshold level to account for variances in background light intensity.

Career Highlights

Joe Danko has dedicated his career to advancing semiconductor inspection technologies. He works at Inspex, Inc., where he continues to innovate and improve methods for ensuring the quality of semiconductor products. His work has been instrumental in enhancing the reliability of semiconductor manufacturing processes.

Collaborations

Throughout his career, Joe has collaborated with talented individuals such as Wo-Tak Wu and Shun-Tak Wu. These collaborations have fostered a creative environment that encourages innovation and problem-solving in the field of semiconductor technology.

Conclusion

Joe Danko's contributions to semiconductor inspection technology exemplify the spirit of innovation. His patent and work at Inspex, Inc. highlight his commitment to improving the quality and reliability of semiconductor products. His efforts continue to impact the industry positively.