Neuenburg am Rhein, Germany

Joachim Nurnus


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Joachim Nurnus: Innovator in Sensor Technology

Introduction

Joachim Nurnus is a notable inventor based in Neuenburg am Rhein, Germany. He has made significant contributions to the field of sensor technology, particularly in the area of temperature measurement. His innovative approach has led to the development of a unique patent that enhances the quality of temperature measurement.

Latest Patents

Joachim Nurnus holds a patent titled "Assessing the measurement quality of the sensor element for measuring an object temperature." This patent describes a sensor element designed to register the temperature of an object. The sensor element includes a substrate with a platform face that defines a first plane. A temperature detector is applied on a first temperature plane on the substrate, which is specifically designed to register the temperature of the object. Additionally, the patent features at least one sensor applied on a first subregion of the substrate to determine a temperature difference within that subregion. A passivation layer is also included, covering the substrate, temperature detector, and sensor, which aids in assessing the measurement quality of the sensor element.

Career Highlights

Joachim Nurnus is associated with Innovator Sensor Technology Ist AG, where he continues to push the boundaries of sensor technology. His work has been instrumental in developing advanced solutions for temperature measurement, showcasing his expertise and commitment to innovation.

Collaborations

Joachim collaborates with Florian Krogmann, contributing to the advancement of sensor technology through their combined efforts.

Conclusion

Joachim Nurnus is a distinguished inventor whose work in sensor technology has led to significant advancements in temperature measurement. His patent reflects his innovative spirit and dedication to improving measurement quality in this critical field.

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