Zhejiang, China

Jie You


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Jie You - Innovator in Nonlinear Parameter Varying Model Identification

Introduction

Jie You is a distinguished inventor based in Zhejiang, China. He has made significant contributions to the field of industrial identification through his innovative work on nonlinear parameter varying models. His expertise and research have led to advancements that are crucial for model-based control and process simulation.

Latest Patents

Jie You holds a patent for a Nonlinear Parameter Varying (NPV) model identification method. This invention discloses a method for identifying nonlinear parameter varying models, which is essential in the industrial identification field. The method involves conducting identification tests and model identification for objects with nonlinear parameter varying characteristics. It includes steps such as local nonlinear model tests and operating point variable transition tests. The resulting models can be utilized in control algorithm design, process simulation, and product quality prediction.

Career Highlights

Jie You is affiliated with Zhejiang University, where he continues to engage in research and development. His work has been instrumental in advancing the understanding and application of nonlinear parameter varying models in various industrial contexts. His contributions have been recognized within the academic and professional communities.

Collaborations

Jie You has collaborated with notable colleagues, including Jiangang Lu and Qinmin Yang. Their joint efforts have furthered research in the field and contributed to the development of innovative solutions.

Conclusion

Jie You's work in nonlinear parameter varying model identification exemplifies the impact of innovative thinking in industrial applications. His contributions are paving the way for advancements in model-based control and quality prediction.

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