Jian Zhang

Title: Innovations of Jian Zhang in Optical Measurement Technology

Introduction

Jian Zhang is a notable inventor based in Cambridge, MA, who has made significant contributions to the field of optical measurement technology. With a total of 2 patents, his work focuses on advancing methods and apparatuses for measuring optical components.

Latest Patents

One of Jian Zhang's latest patents is an automated optical measurement apparatus and method. This innovative apparatus is designed for measuring properties of optical components based on wavefront sensing and analysis. A wavefront of predetermined profile is directed at a surface to be measured, resulting in distortion that corresponds to the shape of the surface. The distorted wavefront is then sensed and analyzed. From the information derived from this analysis, the shape of the surface can be inferred, along with other properties such as radius of curvature, focal length, conic constants, asphericity, toricity, tilt, and decentering. This technology allows for the measurement of concave, convex, cylindrical, and flat parts, as well as wavefront errors in bandpass transmitting components like lenses, filters, and windows.

Career Highlights

Jian Zhang is currently employed at Optikos Corporation, where he continues to develop and refine his innovative optical measurement technologies. His work has positioned him as a key figure in the field, contributing to advancements that benefit various applications in optics.

Collaborations

Some of Jian Zhang's notable coworkers include Stephen D. Fantone and Stephen R. Wilk, who collaborate with him on various projects within the realm of optical measurement.

Conclusion

Jian Zhang's contributions to optical measurement technology through his patents and work at Optikos Corporation highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of optical component measurement.