Jiale Zhang

Title: Jiale Zhang: Innovator in Microscopic Measurement Techniques

Introduction

Jiale Zhang is a prominent inventor based in Nanjing, China. He has made significant contributions to the field of microscopic measurement techniques. His innovative approach has led to advancements in non-destructive measurement methods, particularly in the analysis of microstructure linewidths.

Latest Patents

Jiale Zhang holds a patent for a "Microscopic non-destructive measurement method of microstructure linewidth based on translation difference." This method utilizes a high-precision displacement platform to move a sample, capturing microscopic images before and after displacement. By performing subtraction on these images, a differential image is obtained, allowing for the derivation of a light intensity distribution function. This technique enhances measurement accuracy by overcoming the limitations of conventional microscopic imaging methods.

Career Highlights

Jiale Zhang is affiliated with the Nanjing University of Science and Technology, where he continues to push the boundaries of research in microscopic measurement. His work has garnered attention for its practical applications and innovative methodologies. With a focus on improving measurement accuracy, Zhang's contributions are paving the way for advancements in various scientific fields.

Collaborations

Jiale Zhang has collaborated with notable colleagues, including Zhishan Gao and Jianqiu Ma. Their combined expertise has fostered a productive research environment, leading to significant advancements in their respective fields.

Conclusion

Jiale Zhang's innovative work in microscopic measurement techniques exemplifies the impact of research and development in science. His patented methods not only enhance measurement accuracy but also contribute to the broader field of material science.