Bucheon-si, South Korea

Ji-hoon Na

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovator Spotlight: Ji-hoon Na and His Contributions to Surface Inspection Technology

Introduction: Ji-hoon Na is a prominent inventor based in Bucheon-si, South Korea. He has made significant strides in the field of surface inspection technology through his innovative patent, contributing to advancements in inspection methods that enhance the quality control processes in various industries.

Latest Patents: Ji-hoon Na holds a patent for a "Method of inspecting surface and method of inspecting photomask using the same." This method involves loading an inspection object onto a stage of a multibeam inspection device designed to generate a beam array. The innovative approach allows for the simultaneous scanning of multiple inspection areas, resulting in increased efficiency. The technique identifies one inspection area that is smaller than an area formed by a quadrangle connecting the centers of four adjacent beams. It also incorporates the strategic decision not to scan an adjacent area to streamline the inspection process.

Career Highlights: Ji-hoon Na is affiliated with Samsung Electronics Co., Ltd., where he continues to develop and refine technologies that push the boundaries of inspection methodologies. His work not only reflects his expertise as an inventor but also underscores his commitment to fostering innovation within his company.

Collaborations: In his professional journey, Ji-hoon Na has collaborated with esteemed colleagues such as Dong-gun Lee and Byung-Gook Kim. These collaborations have likely contributed to the exchange of ideas and knowledge, further advancing their collective efforts in research and development.

Conclusion: Ji-hoon Na’s contributions to surface inspection technology mark him as a noteworthy inventor in the field. His patent demonstrates a clear understanding of the complexities involved in inspection methods, which can greatly benefit industries requiring precise quality control. As he continues his work at Samsung Electronics Co., Ltd., the impact of his innovations will likely resonate throughout the technology landscape for years to come.

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