Jeremiah P Schley

Title: Innovations of Jeremiah P. Schley

Introduction

Jeremiah P. Schley is an accomplished inventor based in Columbus, OH. He has made significant contributions to the field of integrated circuit (IC) device inspection. With a total of three patents to his name, Schley's work focuses on enhancing the methods used for non-destructive testing of IC devices.

Latest Patents

One of Schley's latest patents involves systems and methods for the inspection of IC devices. In this innovative approach, one or more images of a Device Under Test (DUT) are received from imaging devices. Observed features are detected in these images, leading to the production of a synthetic representation of the DUT's part design that includes these observed features. Furthermore, the presence of unobserved features is inferred using a mapping and inference model (MIM). These unobserved features are then added to the synthetic representation, enhancing the overall inspection process.

Career Highlights

Jeremiah P. Schley is currently employed at Battelle Memorial Institute, where he continues to develop and refine his innovative ideas. His work has been instrumental in advancing the technology used in IC device inspection, making significant strides in the field.

Collaborations

Some of Schley's notable coworkers include Nicholas Darby and Jeremy Bellay. Their collaboration has contributed to the success of various projects within the institute.

Conclusion

Jeremiah P. Schley is a notable inventor whose work in the inspection of IC devices has led to significant advancements in non-destructive testing methods. His contributions continue to impact the field positively.