Fort Worth, TX, United States of America

Jerald K Beamish


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 49(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Jerald K Beamish: Innovator in Vision Metrology Systems

Introduction

Jerald K Beamish is a notable inventor based in Fort Worth, TX (US). He has made significant contributions to the field of vision metrology systems. His innovative work has led to the development of a unique patent that enhances optical measurement techniques.

Latest Patents

Jerald K Beamish holds a patent for a vision metrology system. This system features one or more vision units, each equipped with a head that includes a primary prism, a primary objective lens, and zoom optics. The optical path allows the image of an object to pass onto an area array sensor. Additionally, the system incorporates a reseau plate with multiple reseaus arranged in a specific pattern. A light source projects the image of the reseaus through the optical path onto the sensor, enabling real-time correction of optical distortion. The unit is designed for movement along two perpendicular axes, with servo control devices operated by a computer to automatically adjust focus, aperture, magnification, and axial position. The system also includes a central control processing head and a manual controller for the vision units.

Career Highlights

Jerald K Beamish is associated with General Dynamics Corporation, where he has contributed to various projects in the field of vision technology. His expertise and innovative approach have made a significant impact on the company's advancements in optical systems.

Collaborations

Jerald has worked alongside his coworker, H Dell Foster, contributing to the development of cutting-edge technologies in their field.

Conclusion

Jerald K Beamish's work in vision metrology systems exemplifies the spirit of innovation and dedication to advancing technology. His contributions continue to influence the industry and inspire future developments in optical measurement techniques.

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