Daejeon, South Korea

Jeong Seok Oh

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.8

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Jeong Seok Oh: Innovator in Distance Measurement Technologies

Introduction

Jeong Seok Oh is a prominent inventor based in Daejeon, South Korea. He has made significant contributions to the field of distance measurement technologies, holding two patents that showcase his innovative approach to multilateration systems and distance measuring devices.

Latest Patents

His latest patents include a "Multilateration system based on absolute distance measurement and multilateration method using the same." This system is designed to obtain spatial coordinates of an object moving in space. It features a tracking unit with multiple tracking devices, each measuring the distance to the object. The system also includes a dead path estimation part and a tracking device position calculation part, which work together to enhance accuracy through nonlinear optimization.

Another notable patent is the "Distance measuring device and measuring method by using visible laser and near-infrared pulse laser." This device measures distances to a target using a near-infrared laser optical system and a visible laser optical system. It calculates distance values based on the signals received from the target, allowing for precise measurements.

Career Highlights

Jeong Seok Oh is affiliated with the Korea Institute of Machinery and Materials, where he continues to develop innovative technologies. His work has significantly advanced the capabilities of distance measurement systems, making them more efficient and reliable.

Collaborations

He collaborates with esteemed colleagues, including Seung Kook Ro and Seong Heum Han, who contribute to his research and development efforts.

Conclusion

Jeong Seok Oh's contributions to distance measurement technologies reflect his dedication to innovation and excellence in engineering. His patents not only enhance the accuracy of spatial measurements but also pave the way for future advancements in the field.

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