Jeong-Hoon Ko

Title: Jeong-Hoon Ko: Innovator in Thickness Measurement Technology

Introduction

Jeong-Hoon Ko is a prominent inventor based in Seoul, South Korea. He is known for his innovative contributions to the field of electronic systems and image processing. His work has led to advancements in measuring the thickness of layers in various structures.

Latest Patents

Jeong-Hoon Ko holds a patent for a method of measuring thickness, processing images, and an electronic system that performs these functions. The patent describes a technique where the thickness of a first layer in a structure can be measured based on an original image of that structure. The process involves identifying the first boundary of the layer in the original image and determining a second boundary that is not easily distinguishable. This is achieved by converting the original image into a first image and generating a second image through filtering. The method allows for precise measurement of the layer's thickness by analyzing the identified boundaries. He has 1 patent to his name.

Career Highlights

Jeong-Hoon Ko is currently employed at Samsung Electronics Co., Ltd., a leading global technology company. His role involves developing innovative solutions that enhance the capabilities of electronic systems. His expertise in image processing and measurement techniques has made significant contributions to the company's research and development efforts.

Collaborations

Throughout his career, Jeong-Hoon Ko has collaborated with notable colleagues, including Min-Chul Park and Je-Hyun Lee. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of cutting-edge technologies.

Conclusion

Jeong-Hoon Ko's work in thickness measurement technology exemplifies the innovative spirit of modern inventors. His contributions continue to influence advancements in electronic systems and image processing.