Company Filing History:
Years Active: 2003
Title: **Innovator Spotlight: Jeong-hoon An**
Introduction
Jeong-hoon An is a notable inventor based in Kyungki-do, South Korea. He has made significant contributions to the field of substrate measurement technology, particularly in the context of semiconductor manufacturing. With one patent to his name, An's work reflects the synthesis of advanced measurement techniques that enhance the accuracy and reliability of wafer surface assessments.
Latest Patents
An's patent titled “Methods and systems for measuring microroughness of a substrate combining particle counter and atomic force microscope measurements” is a pioneering method for assessing the surface of wafers. This innovative approach utilizes a particle counter to capture first measurement data corresponding to multiple points across the wafer surface. Subsequent measurements using an atomic force microscope (AFM) focus on a selected localized area, allowing for precise microroughness evaluation. The integration of these methodologies aims to provide comprehensive data about the wafer surface, which is crucial for semiconductor manufacturers. Notably, the measurement captured by the particle counter may encompass virtually the entire wafer surface, signifying a broad applicability of the technology.
Career Highlights
Jeong-hoon An is professionally affiliated with Samsung Electronics Co., Ltd., a leading global company in electronics and semiconductor technology. His role at Samsung underscores his dedication to advancing innovation in the high-tech industry. An's research and development endeavors exemplify the company’s commitment to cutting-edge technology and excellence in production processes.
Collaborations
An has collaborated with distinguished colleagues Kyoo-chul Cho and Tae-Yeol Heo. Their combined expertise and teamwork have likely contributed to the successful development and refinement of their joint projects, particularly in enhancing the measurement systems pertinent to substrate analysis.
Conclusion
Jeong-hoon An stands out as a significant inventor whose contributions to the measurement technologies in the semiconductor field hold great promise for future advancements. His patent not only showcases innovative techniques but also emphasizes the importance of precision in the manufacturing process. As technology continues to evolve, the impact of inventors like An will be instrumental in shaping the future of the electronics industry.