Jens Struckmeier

Title: Jens Struckmeier: Innovator in Force Scanning Probe Microscopy

Introduction

Jens Struckmeier is a notable inventor based in Santa Barbara, CA (US). He has made significant contributions to the field of microscopy, particularly through his innovative work on force scanning probe microscopes. With a total of 4 patents to his name, Struckmeier continues to push the boundaries of technology in his field.

Latest Patents

Struckmeier's latest patents include a method of making a force curve measurement on a sample using a force scanning probe microscope (FSPM). This advanced FSPM features a piezoelectric scanner that supports the sample and allows movement in three orthogonal directions. The device is equipped with a displacement sensor that measures the sample's movement in a direction orthogonal to the surface, generating a corresponding position signal for closed-loop position feedback. Additionally, a probe is fixed relative to the piezoelectric scanner, and a deflection detection apparatus senses the probe's deflection. The FSPM also includes a controller that generates a scanner drive signal based on the position signal, adapting to user-defined inputs that can modify force curve measurement parameters during data acquisition.

Career Highlights

Jens Struckmeier is currently employed at Veeco Instruments Inc., where he continues to develop and refine his innovative technologies. His work has significantly impacted the field of microscopy, enhancing the capabilities of force measurements on samples.

Collaborations

Struckmeier has collaborated with notable colleagues such as Doug Gotthard and Ben Ohler, contributing to advancements in their shared field of expertise.

Conclusion

Jens Struckmeier is a prominent inventor whose work in force scanning probe microscopy has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to pushing the boundaries of technology.