This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignee: Delta Electronics, Inc.. Active years: 2013-2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Taoyuan Hsien, TW (2015)
- Taoyuan County, TW (2013 - 2016)
Company Filing History:
Years Active: 2013-2016
Title: Jen-Ming Chang: Innovator in Substrate Inspection Technology
Introduction
Jen-Ming Chang is an inventor based in Banciao City, Taiwan. He has made significant contributions to the field of inspection technology, particularly focusing on methods and apparatuses for substrate analysis. Although he currently holds no granted patents, his innovative ideas are reflected in his patent applications.
Latest Patent Applications
One of his notable patent applications is for an "Inspection method and apparatus for substrate." This application describes an inspection apparatus that includes an optical unit generating light to illuminate the substrate, thereby producing an image. The apparatus features a sensor array that receives the image, which contains a light wave within a wave-band range of 700 nm to 1500 nm. Additionally, an image processing unit is included to capture the image effectively.
Conclusion
Jen-Ming Chang's work in substrate inspection technology showcases his innovative spirit and dedication to advancing the field. His patent application reflects a commitment to improving inspection methods, which could have significant implications for various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile