Santa Barbara, CA, United States of America

Jeffrey S Greenberg


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 113(Granted Patents)


Company Filing History:

goldMedal1 out of 832,680 
Other
 patents

Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: The Innovations of Jeffrey S. Greenberg

Introduction

Jeffrey S. Greenberg is a notable inventor based in Santa Barbara, California. He has made significant contributions to the field of optical profiling technology. His work focuses on non-contact methods for analyzing surface profiles and thickness measurements of various materials.

Latest Patents

One of Greenberg's key patents is for an "Optical Profiler for Films and Substrates." This innovative device allows for the determination of the surface profile of a transparent layer on a light-absorbing or opaque substrate. It also measures the surface profile of a light-absorbing or opaque substrate through a transparent layer, as well as the thickness profile of a transparent layer on a light-absorbing or opaque surface. The technology employs a microscope that can operate in both interferometric and spectrophotometric modes. This dual functionality enables the collection of phase data from interference patterns and reflectance data from reflectance patterns. A photo-sensing device captures these patterns and sends the data to a computing device, which processes the information to determine the appropriate surface or film thickness profiles.

Career Highlights

Throughout his career, Greenberg has demonstrated a commitment to advancing optical profiling technology. His innovative approach has led to the development of tools that enhance the accuracy and efficiency of surface analysis in various applications.

Collaborations

Greenberg has worked alongside talented colleagues, including Jay E. Robinson and James M. Young. Their collaborative efforts have contributed to the success of his projects and the advancement of their shared field.

Conclusion

Jeffrey S. Greenberg's contributions to optical profiling technology exemplify the impact of innovation in scientific research and industry applications. His patented inventions continue to influence the way surface profiles and thickness measurements are conducted, showcasing the importance of advancements in this area.

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