For the Inventor, By the Inventor

Enter inventor name

Santa Clara, CA, United States of America

Jed Davidow

USPTO Granted Patents = 6 (Patent Applications = 1)

Average Co-Inventor Count = 3.8

ph-index = 6

Forward Citations = 193(Granted Patents)

Company Filing History:

5 out of 13,706

Applied Materials, Inc.

1 out of 832,812

Other

patents

Years Active: 2002-2005

Loading Chart...

6 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6896763 - Method and apparatus for monitoring a process by employing principal component analysis (2005-05-24),

2. 6589869 - Film thickness control using spectral interferometry (2003-07-08),

3. 6521080 - Method and apparatus for monitoring a process by employing principal component analysis (2003-02-18),

4. 6455437 - Method and apparatus for monitoring the process state of a semiconductor device fabrication process (2002-09-24),

5. 6413867 - Film thickness control using spectral interferometry (2002-07-02),

6. 6368975 - Method and apparatus for monitoring a process by employing principal component analysis (2002-04-09),

This text is generated by artificial intelligence and may not be accurate.

Please report any incorrect information to support@idiyas.com

Loading…