Location History:
- Arcueil, FR (2005 - 2008)
- Moissy-Cramayel, FR (2018)
Company Filing History:
Years Active: 2005-2018
Title: Innovations of Jean-Yves Chatellier
Introduction
Jean-Yves Chatellier is a notable inventor based in Arcueil, France. He has made significant contributions to the field of ultrasound inspection technology. With a total of 3 patents to his name, his work has advanced methods for inspecting objects using ultrasound transmission.
Latest Patents
One of his latest patents is a method for inspection by the transmission of ultrasounds. This method involves sweeping an ultrasound beam over a reference part that shares the same geometry as the object being inspected. The amplitude transmitted through the part is measured to create a mapping. The ultrasound beam is amplified with a reference gain, and gain corrections are determined to ensure a constant amplitude at each point during the sweeping process. Another significant patent focuses on determining the extent of a lateral shadow zone in an ultrasound inspection method. This method measures the effective section of the ultrasound beam at the surface of the part and assesses variations in the amplitude of an echo based on the distance from the beam's axis to the edge of the part.
Career Highlights
Throughout his career, Jean-Yves Chatellier has worked with prominent companies such as Snecma and Snecma Moteurs. His experience in these organizations has contributed to his expertise in ultrasound technology and inspection methods.
Collaborations
He has collaborated with notable coworkers, including Nicolas Broussais-Colella and Jeremy Duval. Their teamwork has likely fostered innovative ideas and advancements in their respective fields.
Conclusion
Jean-Yves Chatellier's contributions to ultrasound inspection technology through his patents and collaborations highlight his role as a significant inventor in this domain. His work continues to influence the methods used in the industry today.