Company Filing History:
Years Active: 2002-2003
Title: Innovations by Jean Luc Pelissier
Introduction
Jean Luc Pelissier is an accomplished inventor based in Palo Alto, CA. He has made significant contributions to the field of temperature control in testing environments. With a total of 2 patents to his name, Pelissier's work focuses on enhancing the efficiency and accuracy of device testing.
Latest Patents
Pelissier's latest patents include a method and apparatus for temperature control of a device under test (DUT) during testing operations. The method involves measuring a parameter related to power consumption by the DUT, such as current consumption. This measurement is then used to operate a temperature control device, compensating for temperature changes due to variations in power consumption. The control can be implemented in either a closed loop or open loop system, with control signals integrated into a test program. The apparatus consists of a device for measuring power consumption, a temperature control device, and a control mechanism that operates the temperature control device based on the measured parameters.
Career Highlights
Pelissier has established himself as a key figure in his field through his innovative approaches to temperature management during device testing. His work at Delta Design, Inc. has allowed him to apply his inventions in practical settings, contributing to advancements in testing methodologies.
Collaborations
Throughout his career, Pelissier has collaborated with notable colleagues, including Thomas P. Jones and Jonathan Eric Turner. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.
Conclusion
Jean Luc Pelissier's contributions to temperature control in testing environments exemplify the impact of innovation in engineering. His patents reflect a commitment to improving testing processes, making him a valuable asset in the field.