Company Filing History:
Years Active: 2015-2021
Title: Jason Higgins: Innovator in Metal Ion Detection Technology
Introduction
Jason Higgins is a notable inventor based in Yacolt, Washington. He has made significant contributions to the field of semiconductor technology, particularly in the detection and trapping of metal ions in solutions. With a total of three patents to his name, Higgins continues to push the boundaries of innovation in his field.
Latest Patents
One of Jason Higgins' latest patents is a solid-state sensor designed for metal ion detection and trapping in solution. This device provides a method for detecting metal ion contamination by utilizing a semiconductor device formed on a semiconductor substrate. The device includes an N-well formed over a P-type substrate, with a contact portion of the N-well in electrical contact with the solution. When optically illuminated, a P/N junction is created due to photovoltaic phenomena. Metal ions from the solution migrate to the contact area because of the voltage generated at the P/N junction. The semiconductor device features a conductive structure with conductive elements separated by a gap, initially in an electrically open state. As ions migrate to the contact area, they precipitate and partially bridge the gap, creating conductance through the conductive structure. This conductance can be measured to determine the level of metal ion contamination.
Career Highlights
Jason Higgins is currently employed at WaferTech, Inc., where he applies his expertise in semiconductor technology. His work focuses on developing innovative solutions for detecting contaminants in various solutions, which has significant implications for environmental monitoring and industrial applications.
Collaborations
Higgins collaborates with Re-Long Chiu, a fellow innovator in the field. Their partnership enhances the research and development efforts at WaferTech, Inc., leading to advancements in semiconductor applications.
Conclusion
Jason Higgins is a prominent figure in the field of semiconductor technology, particularly in the area of metal ion detection. His innovative patents and contributions to WaferTech, Inc. highlight his commitment to advancing technology for practical applications.