LR Vaals, Netherlands

Jan Van Der Kruk

USPTO Granted Patents = 1 

 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Jan Van Der Kruk: Innovator in Electromagnetic Induction Measurement Systems

Introduction

Jan Van Der Kruk is a notable inventor based in LR Vaals, Netherlands. He has made significant contributions to the field of electromagnetic induction measurement systems. His innovative approach has led to the development of a unique calibration method that enhances the accuracy of these systems.

Latest Patents

Jan Van Der Kruk holds a patent for a "Calibration method for electromagnetic induction measurement systems, and apparatus." This method involves transmitting a magnetic field as a primary signal, which triggers a current in the soil. The current generates a secondary signal that is recorded by a receiver at various heights. This process creates an input vector that combines soil and environmental properties, ultimately leading to a dataset of conductivity values across different layers.

Career Highlights

Throughout his career, Jan has worked with esteemed organizations such as Forschungszentrum Jülich GmbH. His work at these institutions has allowed him to refine his expertise in electromagnetic induction and contribute to advancements in measurement technologies.

Collaborations

Jan has collaborated with notable colleagues, including Xihe Tan and Achim Mester. Their combined efforts have furthered research and development in the field of electromagnetic measurement systems.

Conclusion

Jan Van Der Kruk's innovative contributions to electromagnetic induction measurement systems demonstrate his commitment to advancing technology in this area. His patent and career achievements reflect his expertise and dedication to innovation.

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