Willow Grove, PA, United States of America

James U Eynon


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 1976

Loading Chart...
1 patent (USPTO):Explore Patents

Title: James U Eynon: Innovator in Ion Concentration Measurement

Introduction

James U Eynon is a notable inventor based in Willow Grove, PA (US). He has made significant contributions to the field of ion concentration measurement, showcasing his expertise through his innovative patent.

Latest Patents

Eynon's most recent patent focuses on cation concentration measurements. This invention involves the addition of a selected base to a sample liquid, which effectively reduces the hydrogen ion content without introducing other cations that could affect the measuring electrode's sensitivity. The patent highlights the use of high molecular weight bases, particularly secondary and tertiary amines, as suitable options. The system includes an absorber that mixes the sample liquid with a gaseous base, mechanisms for pressurizing the reference electrode, and an analyzer cell designed to prevent contamination of the measuring electrode. Additionally, a separate reservoir is utilized for mixing known concentration solutions for calibration purposes. The concentration readout meter features an auxiliary dial to facilitate easy calibration.

Career Highlights

James U Eynon is associated with Leeds & Northrup Company, where he has applied his innovative ideas to advance measurement technologies. His work has contributed to the development of more accurate and reliable methods for ion concentration measurement.

Collaborations

Eynon has collaborated with notable coworkers, including Edgar L Eckfeldt and William E Proctor, who have also contributed to advancements in measurement technologies.

Conclusion

James U Eynon's contributions to ion concentration measurement through his innovative patent reflect his dedication to advancing technology in this field. His work continues to influence measurement practices and enhance accuracy in scientific applications.

This text is generated by artificial intelligence and may not be accurate.
Please report any incorrect information to support@idiyas.com
Loading…