James Tom Pye

Title: James Tom Pye: Innovator in Anomaly Detection

Introduction

James Tom Pye is a notable inventor based in Santa Clara, CA (US). He has made significant contributions to the field of anomaly detection, particularly in sensor data analysis. His innovative approach has implications for various industries, especially in substrate processing.

Latest Patents

James Tom Pye holds a patent for a method titled "Anomaly detection with correlation coefficients." This patent describes a technique for detecting anomalies in sensor data generated in a substrate processing apparatus. The method involves receiving multiple data sets, selecting data from sensor pairs, and generating a reference correlation. The process normalizes the differences in data correlation to identify anomalies effectively. Adjustments to process parameters are made based on the identified anomalies, enhancing the reliability of the substrate processing apparatus.

Career Highlights

James Tom Pye is currently employed at Applied Materials, Inc., where he applies his expertise in sensor data analysis. His work focuses on improving the efficiency and accuracy of substrate processing through innovative detection methods. With a patent portfolio that includes one significant patent, he continues to contribute to advancements in technology.

Collaborations

James has collaborated with talented coworkers such as Heng Hao and Sreekar Bhaviripudi. Their combined efforts in research and development have fostered a collaborative environment that drives innovation at Applied Materials, Inc.

Conclusion

James Tom Pye is a distinguished inventor whose work in anomaly detection has the potential to transform substrate processing technologies. His contributions reflect a commitment to innovation and excellence in the field.