James Reid McNab

Title: Innovations of James Reid McNab

Introduction

James Reid McNab is a notable inventor based in Aberdeenshire, GB. He has made significant contributions to the field of X-ray inspection technology, holding a total of 2 patents. His work focuses on enhancing inspection systems, particularly in subsea environments.

Latest Patents

One of McNab's latest patents is the "Trip avoidance X-ray inspection" system. This specialized system delivers pulsed X-rays and includes one or more pulse X-ray cameras, a predetermined set of shielded X-ray sources, and nucleonic instrumentation. The system is designed to create X-ray images when positioned near the nucleonic instrumentation. Another significant patent is the "Subsea computed tomography system with flat panel detectors." This system can be deployed by subsea vehicles or divers to perform CT inspections on subsea structures. It utilizes a marinized signal source and flat panel signal detector to acquire 2D radiographic images, which are then processed to produce a 3D reconstructed volume of the inspected structure.

Career Highlights

James Reid McNab is currently employed at Oceaneering International, Inc., where he continues to innovate in the field of inspection technologies. His work has been instrumental in advancing the capabilities of subsea inspection systems.

Collaborations

Throughout his career, McNab has collaborated with talented individuals such as Rajashekar Venkatachalam and Michael William Killeen. These collaborations have contributed to the development of cutting-edge technologies in the field.

Conclusion

James Reid McNab's contributions to X-ray inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in subsea inspections and provide solutions that enhance safety and efficiency.