Company Filing History:
Years Active: 1993
Title: The Innovations of James N Liu
Introduction
James N Liu is a notable inventor based in San Jose, California. He has made significant contributions to the field of noise measurement technology. His work focuses on improving the accuracy and efficiency of measuring noise parameters in various devices.
Latest Patents
James N Liu holds a patent for an innovative apparatus designed for measuring the noise figure and y-factor. This invention, titled "Apparatus for measuring the noise parameters of a device under test (DUT)," provides full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus integrates an S-parameter measuring device, such as a vector network analyzer (VNA), with a noise module. The noise module features a pair of test ports for the DUT, a noise source that can be controlled externally, a receiver, and a switch for coupling the output of the DUT to either the receiver or port 2 of the VNA.
Career Highlights
James N Liu is currently employed at Wiltron Company, where he continues to develop and refine his inventions. His expertise in noise measurement has positioned him as a valuable asset in his field.
Collaborations
James has collaborated with notable colleagues, including Martin I Grace and Donald Anthony Bradley, who have contributed to his innovative projects.
Conclusion
James N Liu's contributions to noise measurement technology exemplify the spirit of innovation. His patent reflects a commitment to advancing the field and improving measurement accuracy. His work continues to influence the industry positively.