Lee, NH, United States of America

James M Ryan

USPTO Granted Patents = 4 


 

Average Co-Inventor Count = 2.1

ph-index = 2

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2001-2016

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4 patents (USPTO):Explore Patents

Title: Innovations of James M. Ryan

Introduction

James M. Ryan is a notable inventor based in Lee, New Hampshire, with a significant contribution to the field of neutron and gamma-ray detection. He holds a total of four patents, showcasing his expertise and innovative spirit in developing advanced detection systems.

Latest Patents

Among his latest inventions is the "Tri-material dual-species neutron/gamma spectrometer." This system is capable of detecting, imaging, and measuring both neutrons and gamma rays. It features a plurality of parallel plates, each containing various detectors, including non-PSD organic scintillation detectors, scintillation detectors with pulse-shape discrimination (PSD) properties, and inorganic scintillation detectors. Additionally, the system can utilize scintillation rods radially distributed about a central axis for enhanced detection capabilities. Another significant patent is the "Neutron and gamma-ray detection system," which is a radially symmetric imaging detector that measures the energy of incident neutrons or gamma rays and identifies their source on an event-by-event basis.

Career Highlights

James M. Ryan is affiliated with the University of New Hampshire, where he continues to contribute to research and development in his field. His work has led to advancements in detection technologies that are crucial for various applications in science and industry.

Collaborations

He has collaborated with notable colleagues, including John R. Macri and Mark L. McConnell, further enhancing the impact of his research and innovations.

Conclusion

James M. Ryan's contributions to neutron and gamma-ray detection technologies exemplify his innovative approach and dedication to advancing scientific knowledge. His patents reflect a commitment to improving detection systems, which are vital for numerous applications.

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