James L Wilkes

Title: James L. Wilkes: Innovator in Surface Inspection Technology

Introduction

James L. Wilkes is a notable inventor based in Matthews, NC (US). He has made significant contributions to the field of surface inspection technology, particularly through his innovative patent. His work has implications for various industries, especially in electronics.

Latest Patents

James L. Wilkes holds a patent for a "Surface Inspection Scanning System." This system utilizes laser scanning to inspect relatively movable reflective surface elements. By monitoring the reflected energy in both light and dark channel receivers, the system can detect flaws on the surface of the element. The types of flaws present affect the frequency components in the reflected energy, which in turn influences the amount of energy reflected to the receivers. The system includes circuitry designed to detect and classify these flaws as they are scanned. It computes the condition of the inspected element and grades it as either acceptable or in one of several unacceptable states. The reflective surface element described in the patent is a silicon wafer, commonly used as a substrate in the fabrication of integrated circuits and other electronic components.

Career Highlights

James L. Wilkes is associated with Aeronca Electronics, Inc., where he applies his expertise in surface inspection technology. His work at the company has contributed to advancements in the field, enhancing the quality and reliability of electronic components.

Collaborations

Some of his notable coworkers include W. Jerry Alford and Charles J. Cushing. Their collaboration has likely fostered an environment of innovation and creativity within the company.

Conclusion

James L. Wilkes is a distinguished inventor whose work in surface inspection technology has made a significant impact on the electronics industry. His patent for a surface inspection scanning system exemplifies his innovative spirit and dedication to improving technology.