Edgewood, NM, United States of America

James H Lee, Jr

This inventor holds 1 USPTO granted patent. Top assignee: Sandia Corporation. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: James H Lee, Jr. Retrieved from https://idiyas.com/inventor/james-h-lee-jr

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Discovering James H. Lee, Jr.: Innovator in Container Inspection Technology

Introduction

James H. Lee, Jr. is an accomplished inventor based in Edgewood, New Mexico, recognized for his innovative contributions in the field of container inspection technology. His commitment to advancing efficient inspection methods has led to the development of a pioneering apparatus that supports improved safety and quality measures in various industries.

Latest Patents

Lee holds a significant patent titled "Apparatus for Inspecting a Group of Containers and Method of Using Same." This invention presents an apparatus and method for inspecting multiple containers, each housing materials within. The system integrates an inspection vehicle equipped with wheels and magnets, designed to adhere to the outer surfaces of containers, allowing the vehicle to navigate around them effortlessly. Moreover, the invention incorporates a detector that is deployable to measure crucial characteristics of the containers, enhancing overall inspection capabilities. The development of this technology marks a notable advancement in ensuring container integrity and safety.

Career Highlights

Currently working at Sandia Corporation, James H. Lee, Jr. has made his mark as a professional innovator. His technical expertise has enabled the design of this advanced inspection mechanism, reflecting his ability to combine practical application with scientific principles. Lee's dedication to research and development continues to contribute significantly to his field.

Collaborations

Throughout his career, Lee has collaborated with notable colleagues, including Jonathan R. Salton and Barry Louis Spletzer. These partnerships have fostered a collaborative environment that cultivates innovation and effectiveness in addressing complex challenges in container inspection.

Conclusion

In summary, James H. Lee, Jr. stands as a pivotal figure in the field of container inspection technology, with his patent showcasing innovative solutions for enhancing safety and efficiency. His work at Sandia Corporation, in collaboration with other esteemed professionals, continues to pave the way for future developments in the industry. Lee's commitment to innovation reflects the importance of continued research and adaptation in an ever-evolving technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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