Company Filing History:
Years Active: 1997-1998
Title: Innovations of James Frederick Cunningham
Introduction
James Frederick Cunningham is a notable inventor based in Lincoln, MA (US). He has made significant contributions to the field of material analysis through his innovative patents. With a total of 3 patents, Cunningham has developed advanced technologies that enhance the understanding and monitoring of materials.
Latest Patents
Cunningham's latest patents include a laser ultrasonics-based material analysis system and method. This invention utilizes a method and apparatus for interferometrically monitoring a target to determine the optimum period for obtaining a data point. Upon detecting this period, an impulse source, such as an impulse laser, is triggered to launch an elastic wave within the target, allowing for accurate data collection. Another significant patent is an interferometric-based materials analysis system that employs a novel combination of laser beam shaping and pointing techniques. This system utilizes a low-cost, rugged, and compact diode laser as a detection laser, along with signal processing techniques that compensate for inherent instabilities and short-term drift in the diode laser. The matched filter processing technique disclosed in this patent is particularly useful for detecting and analyzing Lamb modes within thin targets, such as silicon wafers undergoing rapid thermal processing cycles.
Career Highlights
Throughout his career, Cunningham has worked with prominent companies, including Textron Systems Corporation and Textron Defense Systems, a division of Avco Corporation. His experience in these organizations has contributed to his expertise in material analysis and laser technology.
Collaborations
Cunningham has collaborated with notable individuals in his field, including Petros Amestis Kotidis and Paul Fred Gozewski. These collaborations have further enriched his work and innovations.
Conclusion
James Frederick Cunningham is a distinguished inventor whose work in laser ultrasonics and material analysis has paved the way for advancements in the field. His innovative patents and career achievements reflect his dedication to enhancing material monitoring technologies.