James D Ayres

Title: Innovations of James D. Ayres

Introduction

James D. Ayres is a notable inventor based in Tucson, Arizona. He has made significant contributions to the field of measurement technology, holding three patents that showcase his innovative spirit and technical expertise. His work primarily focuses on methods and apparatuses that enhance the precision of measurements in various applications.

Latest Patents

One of his latest patents is an "Apparatus and method for simultaneous measurement of film thickness." This invention allows for the simultaneous measurement of the relative height variation and thickness of a film on an object. The process involves producing interference patterns at different wavelengths, measuring intensities, and computing phase values to determine surface height changes accurately. Another significant patent is for an "Apparatus and method for automatically focusing an interference microscope." This invention utilizes a point detector to sense interference patterns, enabling automatic focusing of the microscope, which enhances measurement accuracy and efficiency.

Career Highlights

James D. Ayres has built a successful career at Wyko, Inc., where he has applied his innovative ideas to develop advanced measurement technologies. His work has contributed to the company's reputation as a leader in precision measurement solutions.

Collaborations

Throughout his career, Ayres has collaborated with notable colleagues, including Donald K. Cohen and Eugene R. Cochran. These partnerships have fostered a creative environment that has led to the development of groundbreaking technologies.

Conclusion

James D. Ayres exemplifies the spirit of innovation through his patents and contributions to measurement technology. His work continues to influence the field and inspire future advancements.