Company Filing History:
Years Active: 1997
Title: Innovations of James C Patrikis
Introduction
James C Patrikis is an accomplished inventor based in Nashua, NH (US). He has made significant contributions to the field of automatic frequency control systems. His innovative work has led to the development of a unique patent that enhances the accuracy of measuring short duration radio frequencies.
Latest Patents
James C Patrikis holds a patent for a "Circuit for short duration multiple look pulse based frequency." This low-cost automatic frequency control system measures short duration radio frequencies with a high degree of accuracy within 0.5 MHz. The system is programmable, allowing applicability over a wide range of frequencies while maintaining the required accuracy and various signal durations. It includes circuits to digitize the source signal into a digital pulse train and asynchronously sample the pulse train to obtain a count of the positive edges of the pulses over a sufficient number of samples. A microprocessor computes the statistical average of the count and accurately determines the frequency of the source signal. Additionally, the system features a feedback path to implement corrections to the source signal based on the measured frequency.
Career Highlights
James C Patrikis is currently employed at Raytheon Company, where he continues to innovate and contribute to advancements in technology. His work at Raytheon has positioned him as a key player in the development of cutting-edge solutions in the field of frequency control systems.
Collaborations
Throughout his career, James has collaborated with notable colleagues, including Mark J Donovan and Irl W Smith. These collaborations have further enriched his work and contributed to the success of various projects.
Conclusion
James C Patrikis is a notable inventor whose contributions to automatic frequency control systems have made a significant impact in the field. His innovative patent demonstrates his commitment to advancing technology and improving accuracy in radio frequency measurements.