Company Filing History:
Years Active: 2022
Title: **Innovative Contributions of Inventor Jaecheong Lee**
Introduction
Jaecheong Lee is a notable inventor based in Asan-si, South Korea, recognized for his contributions to the field of electronic testing. With a focus on advancing technology, he has been instrumental in developing innovative solutions that enhance the capabilities of testing electronic apparatuses that incorporate semiconductor devices.
Latest Patents
Jaecheong Lee holds a patent for a "Test board and test apparatus including a multi-type fluid supplier for testing electronic apparatuses having semiconductor devices." This invention provides a unique test board comprising a base plate that features a connector and multiple mounting areas arranged in a matrix format. It includes several test units designed to enhance the performance of semiconductor devices by supplying a test fluid at a specific temperature and a supplementary fluid that helps maintain a consistent temperature difference between the actual temperature of the test objects and the predetermined test temperature.
Career Highlights
Currently, Jaecheong Lee is employed by Samsung Electronics Co., Ltd., a leading global provider of technology solutions. His work at Samsung has allowed him to leverage cutting-edge technology and collaborate with some of the brightest minds in the industry, contributing to numerous advancements in electronic testing methods.
Collaborations
Throughout his career, Jaecheong Lee has worked alongside talented colleagues, including Hyeju Kim and Youngchul Lee. Their collaborative efforts have significantly impacted the development of innovative technologies and testing methodologies that are critical in the ever-evolving field of electronics.
Conclusion
Jaecheong Lee's inventive spirit and dedication to enhancing electronic testing practices underscore his importance in the technology industry. His patent and collaborations showcase his commitment to innovation and improvement, paving the way for future advancements in semiconductor testing and electronic apparatus performance.