Jack E Abbott

Title: Jack E Abbott - Innovator in Non-Contact Measurement Techniques

Introduction

Jack E Abbott is a notable inventor based in Santa Cruz, California. He has made significant contributions to the field of optical measurement techniques, particularly in the area of non-contact high-resolution displacement measurement. His innovative approach has paved the way for advancements in precision measurement technologies.

Latest Patents

Jack E Abbott holds a patent for a non-contact high-resolution displacement measurement technique. This apparatus is designed to optically detect the position of an edge of a workpiece, such as an integrated circuit lead tip, within a sensing plane. The method involves emitting electromagnetic energy from a known source region, which causes the edge to create a shadow with a penumbra in the sensing plane. Two detectors measure the energy reaching two known detection regions within the penumbra. The energy detected by each detector helps to determine curves in the sensing plane, and their intersection accurately identifies the position of the edge. Additionally, the patent includes algorithms for calculating coplanarity and methods for rotating workpieces for comprehensive scanning.

Career Highlights

Jack E Abbott is associated with Micro Component Technology, Inc., where he has applied his expertise in optical measurement. His work has contributed to the development of advanced measurement systems that enhance the accuracy and efficiency of various manufacturing processes.

Collaborations

Jack has collaborated with notable colleagues, including Andrew P Sabersky and Nicholas Littlestone. Their combined efforts have furthered the research and development of innovative measurement technologies.

Conclusion

Jack E Abbott's contributions to non-contact measurement techniques exemplify the spirit of innovation in the field of optical technology. His patent and collaborative efforts continue to influence advancements in precision measurement systems.