Muko, Japan

Isao Nakanishi



Average Co-Inventor Count = 3.3

ph-index = 1


Location History:

  • Kyoto, JP (2020)
  • Muko, JP (2020 - 2021)

Company Filing History:


Years Active: 2020-2021

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3 patents (USPTO):Explore Patents

Title: Isao Nakanishi: Innovator in Inspection Management Systems

Introduction

Isao Nakanishi is a notable inventor based in Muko, Japan. He has made significant contributions to the field of inspection management systems, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of inspection processes in manufacturing.

Latest Patents

Nakanishi's latest patents include an inspection management system, inspection management apparatuses, and an inspection management method. The inspection management system he developed features a plurality of processes that manage both final inspections of completed products and intermediate inspections of products manufactured in earlier processes. Key components of this system include an inspection content data acquisition unit, an inspection content setting unit, a simulation unit, an inspection standard calculation unit, and an output unit. These elements work together to ensure that inspection standards are continuously improved based on simulations and data analysis.

Another patent focuses on managing inspections of inspection apparatuses within a production line. This system includes an acquisition unit for inspection content data, a setting-related information acquisition unit, a storage unit for retaining historical data, and an output unit for displaying this information. This innovative approach allows for better tracking and management of inspection processes.

Career Highlights

Throughout his career, Isao Nakanishi has worked with prominent companies such as Omron Corporation and Shimadzu Corporation. His experience in these organizations has contributed to his expertise in developing advanced inspection management technologies.

Collaborations

Nakanishi has collaborated with notable colleagues, including Hiroyuki Mori and Katsuki Nakajima. Their combined efforts have furthered advancements in the field of inspection management.

Conclusion

Isao Nakanishi's contributions to inspection management systems demonstrate his commitment to innovation and quality in manufacturing processes. His patents reflect a deep understanding of the complexities involved in inspections, making him a key figure in this field.

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