Wiesbaden, Germany

Ingo Tzschichholtz


 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Ingo Tzschichholtz: Innovator in Height Measurement Technology

Introduction

Ingo Tzschichholtz is a notable inventor based in Wiesbaden, Germany. He has made significant contributions to the field of measurement technology, particularly in methods for assessing the height of objects. His innovative approach combines light projection and coded patterns to achieve precise measurements.

Latest Patents

Ingo Tzschichholtz holds a patent for a method and light pattern for measuring the height or height profile of an object. This method involves projecting a light pattern with successive coded picture elements onto an object using a light source. Each picture element contains coding features that collectively form a code word. The method captures the light pattern with a picture sensor positioned off-set from the light source. By determining the positions of the picture element groups, the height of the object can be accurately assessed in comparison to a reference position. He has 1 patent to his name.

Career Highlights

Throughout his career, Ingo Tzschichholtz has worked with prominent companies in the field of image processing. Notably, he has been associated with Vitronic Dr.-Ing. Stein Bildverarbeitungssysteme GmbH, where he contributed to advancements in measurement technologies. His expertise has played a crucial role in developing innovative solutions for height measurement.

Collaborations

Ingo Tzschichholtz has collaborated with various professionals in his field, including Burghard Hoffmann. Their joint efforts have furthered the development of measurement technologies and enhanced the accuracy of height assessments.

Conclusion

Ingo Tzschichholtz is a distinguished inventor whose work in height measurement technology has made a significant impact. His innovative methods and collaborations continue to influence the field, showcasing the importance of advancements in measurement techniques.

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