Hayward, CA, United States of America

Igor Iosilevsky


Average Co-Inventor Count = 4.8

ph-index = 2

Forward Citations = 65(Granted Patents)


Company Filing History:


Years Active: 1998-1999

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2 patents (USPTO):Explore Patents

Title: Igor Iosilevsky: Innovator in Optical Inspection Technologies

Introduction

Igor Iosilevsky is a notable inventor based in Hayward, California, recognized for his contributions to optical inspection technologies. With a total of two patents to his name, Iosilevsky has developed innovative methods and apparatuses that enhance the quality control processes in data recording mediums.

Latest Patents

Iosilevsky's latest patents include an "Apparatus and method for surface inspection by specular interferometric" and a "Method and apparatus for combined glide and defect analysis." The first patent describes a versatile noncontact optical inspection instrument designed for inspecting magnetic disk surfaces for defects. This instrument can measure surface defects such as bumps, pits, and scratches, as well as contaminants like particles and stains. It employs two identical optical sensors that scan both surfaces of the disk simultaneously, providing comprehensive inspection capabilities.

The second patent focuses on detecting defects on the surface of a data recording medium. It features a sensor that generates an analog voltage signal representative of surface anomalies. This signal is processed to detect and convert peaks into digital data, allowing for detailed analysis of defect characteristics.

Career Highlights

Iosilevsky's work at Phase Metrics, Inc. has positioned him as a key player in the field of optical inspection. His innovative approaches have significantly contributed to advancements in quality assurance for data storage technologies.

Collaborations

Throughout his career, Iosilevsky has collaborated with notable professionals such as George A Burt, Jr. and Peter C Jann, further enhancing the impact of his inventions.

Conclusion

Igor Iosilevsky's contributions to optical inspection technologies demonstrate his commitment to innovation and quality in the field of data recording. His patents reflect a deep understanding of the challenges in surface inspection, making him a valuable inventor in this domain.

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