Company Filing History:
Years Active: 2022-2024
Title: Hye Soo Lee: Innovator in Security and Memory Testing Technologies
Introduction
Hye Soo Lee is a prominent inventor based in Yongin-si, South Korea. He has made significant contributions to the fields of security devices and memory testing technologies. With a total of 2 patents to his name, Lee's work is recognized for its innovative approaches to enhancing device security and testing methodologies.
Latest Patents
Hye Soo Lee's latest patents include a security device and an electronic device that features a secure boot management system. His inventions encompass methods for generating a boot image and executing a boot chain. The security device is designed to include a key deriver that receives a root key and a protected boot key from a boot image. It generates a derived key using a key protection method. Additionally, a key processor performs verification to extract a boot key from the protected boot key. The secure booter then verifies a protected execution image using the extracted boot key, while a processor executes the verified execution image. Another notable patent involves a memory test apparatus and its testing method, which utilizes a built-in self-test (BIST) approach. This method allows for testing a memory device based on received test commands, providing results that indicate pass or fail outcomes.
Career Highlights
Hye Soo Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to innovate and develop cutting-edge technologies. His work at Samsung has positioned him as a key player in the advancement of security and memory testing solutions.
Collaborations
Lee has collaborated with notable colleagues, including Hong-mook Choi and Ji-su Kang, contributing to a dynamic work environment that fosters innovation and creativity.
Conclusion
Hye Soo Lee's contributions to security devices and memory testing technologies highlight his role as a leading inventor in the tech industry. His patents reflect a commitment to enhancing device security and improving testing methodologies.