Taichung, Taiwan

Hsi-Lien Hsiao

This inventor holds 2 USPTO granted patents. Top assignee: Tunghai University. Active years: 2013-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsi-Lien Hsiao. Retrieved from https://idiyas.com/inventor/hsi-lien-hsiao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2013-2015

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2 patents (USPTO):Explore Patents

Title: Hsi-Lien Hsiao: Innovator in Semiconductor Technology

Introduction

Hsi-Lien Hsiao is a prominent inventor based in Taichung, Taiwan. She has made significant contributions to the field of semiconductor technology, holding two patents that showcase her innovative approach to manufacturing and materials.

Latest Patents

Hsi-Lien Hsiao's latest patents include a method for manufacturing a semiconductor nano layer structure. This method involves providing two substrates, forming semiconductor nanowires on one substrate, and creating an absorption surface on the other. The process utilizes a cylindrical roller to transfer and bond the semiconductor nanowires, resulting in a functional semiconductor nano layer structure. Her second patent focuses on a vertically oriented nanometer-wires structure, which consists of a non-crystalline base and straight nanometer-wires. These wires are uniformly distributed and orthogonal to the base, making the structure applicable in various fields such as semiconductor, optoelectronic, biological, and energy.

Career Highlights

Hsi-Lien Hsiao is affiliated with Tunghai University, where she continues to advance her research and development in semiconductor technologies. Her work has garnered attention for its potential applications and innovative methodologies.

Collaborations

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Conclusion

Hsi-Lien Hsiao's contributions to semiconductor technology through her patents reflect her dedication to innovation and research. Her work not only advances the field but also opens new avenues for future applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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