Chengdu, China

Hongsong Ni

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Other. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hongsong Ni. Retrieved from https://idiyas.com/inventor/hongsong-ni

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,513 
Other
 patents

Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Hongsong Ni: Innovator in Flash Memory Technology

Introduction

Hongsong Ni is a notable inventor based in Chengdu, China. He has made significant contributions to the field of flash memory technology. His innovative work focuses on improving the efficiency of programming circuits used in flash memory devices.

Latest Patents

Hongsong Ni holds 1 patent for his invention titled "Programming circuit and programming method of flash memory." This invention relates to a programming circuit that includes a programming transistor and a storage cell connected in series. The design enhances the efficiency of the programming process without increasing channel current, thereby shortening the total programming time and improving overall performance.

Career Highlights

Throughout his career, Hongsong Ni has demonstrated a commitment to advancing technology in the field of memory storage. His work has been instrumental in developing methods that optimize the programming of flash memory, which is crucial for various electronic devices.

Collaborations

Hongsong Ni has worked alongside his coworker, Ming Wang, contributing to the development of innovative solutions in their field.

Conclusion

Hongsong Ni's contributions to flash memory technology exemplify the impact of innovative thinking in the electronics industry. His patent reflects a significant advancement that enhances the efficiency and performance of flash memory devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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