Suwon, South Korea

Ho Sik Kim


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1999-2000

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2 patents (USPTO):Explore Patents

Title: Ho Sik Kim - Innovator in Semiconductor Technology

Introduction

Ho Sik Kim is a prominent inventor based in Suwon, South Korea. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on preventing structural issues in semiconductor devices, which is crucial for enhancing their performance and reliability.

Latest Patents

Ho Sik Kim's latest patents include innovative methods for preventing cracks in insulating spaces between metal wiring in semiconductor devices. The first patent describes a semiconductor device that features a metal layer pattern designed to prevent cracks from forming in insulating spaces. This device consists of multiple metal layers stacked vertically, with insulating layers interposed between them. A metal wiring pattern is formed on each metal layer, and the insulating spaces are vertically shifted in relation to neighboring layers. The second patent also addresses the same issue, emphasizing the importance of structural integrity in semiconductor devices.

Career Highlights

Ho Sik Kim is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to push the boundaries of semiconductor technology, contributing to the development of more reliable and efficient devices.

Collaborations

Throughout his career, Ho Sik Kim has collaborated with notable colleagues, including Han Seong Kim and Young Soo Jeon. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Ho Sik Kim's contributions to semiconductor technology are noteworthy, particularly in the area of preventing structural failures in devices. His patents reflect a commitment to advancing the field and improving the reliability of electronic components.

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