Location History:
- Asaka, JP (2007 - 2010)
- Tokyo, JP (1998 - 2018)
Company Filing History:
Years Active: 1998-2018
Title: Hitoshi Yamashita: Innovator in Imaging Technology
Introduction
Hitoshi Yamashita is a notable inventor based in Asaka, Japan. He has made significant contributions to the field of imaging technology, holding a total of 5 patents. His work focuses on enhancing the quality and efficiency of image capturing and inspection processes.
Latest Patents
Yamashita's latest patents include a pill inspection apparatus and method. This innovative apparatus features an illumination portion that irradiates light to a medical envelope containing a translucent pill. The imaging portion captures a transmission image of the envelope, while the image processing portion detects the pill based on its brightness values. This technology allows for uniform outline inspection of translucent pills, regardless of shooting position or permeation rate.
Another significant patent is related to a signal processing method for image capturing apparatus. This invention ensures that desired image quality is maintained, regardless of the transfer efficiency of a CCD image capturing element. By acquiring various information such as camera sensitivity and internal temperature, the signal processing adapts to suppress image quality deterioration.
Career Highlights
Yamashita has worked with prominent companies in the imaging industry, including Fujifilm Corporation and Fuji Photo Film Company, Limited. His experience in these organizations has contributed to his expertise in developing advanced imaging technologies.
Collaborations
Throughout his career, Yamashita has collaborated with talented individuals such as Masahiro Konishi and Chiaki Ichikawa. These partnerships have fostered innovation and creativity in his projects.
Conclusion
Hitoshi Yamashita's contributions to imaging technology through his patents and collaborations highlight his role as a significant inventor in the field. His work continues to influence advancements in image capturing and inspection methods.